Measure Twice, Cut Once: Entrepreneurial Ecosystem Metrics

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Authors: Jip Leendertse, Mirella Schrijvers, Erik Stam

Journal title: Research Policy

Journal publisher: Elsevier BV

Published year: 2021

Published pages: 104336

DOI identifier: 10.1016/j.respol.2021.104336

ISSN: 0048-7333