Design and Verification of Test structures for Complex Multilayer-PCB Interconnections

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Maren Willemsen, Jens Leiß, Marta Martínez-Vázquez

Journal title: German Microwave Conference GeMIC 2020

Journal publisher: VDE

Published year: 2020