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Authors: I.Marozau S.Unterhofer M.Berry G.Aubry P.Gonin R.Enquebecq M.Dadras O.Sereda
Journal title: Microelectronics Reliability
Journal number: Volume 138, November 2022, 114753
Journal publisher: Elsevier BV
Published year: 2022
ISSN: 0026-2714