From the Measurement of COSS–VDS Characteristic to the Estimation of the Channel Current in Medium Voltage SiC MOSFET Power Modules

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Authors: J. Rąbkowski, M. Zdanowski, R. Kopacz, F. Gonzalez-Hernando, I. Villar and U. Larrañaga

Journal title: IEEE Transactions on Instrumentation and Measurement

Journal number: Art no. 9003210

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

Published pages: vol. 72, pp. 1-10

DOI identifier: 10.1109/tim.2023.3291788

ISSN: 0018-9456