Contactless RF Probe Interconnect Technology Enabling Broadband Testing to the Terahertz Range

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Authors: A. Rivera-Lavado, M. Ali, D. Gallego-Cabo, L. -E. García-Muñoz, D. Lioubtchenko and G. Carpintero

Journal title: IEEE Transactions on Terahertz Science and Technology

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

DOI identifier: 10.1109/tthz.2022.3213470

ISSN: 2156-342X