Summary
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Authors: D. Braun, S. Lukas, L. Völkel, O. Hartwig, M. Prechtl, M. Belete, S. Kataria, T. Wahlbrink, A. Daus, G. S. Duesberg, and M. C. Lemme
Journal title: 2022 Device Research Conference (DRC)
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/drc55272.2022.9855787