Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

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Authors: B. M. Szydłowska, O. Hartwig, B. Tywoniuk, T. Hartman, T. Stimpel-Lindner, Z. Sofer, N. McEvoy, G. S. Duesberg, C. Backes

Journal title: 2D Materials

Journal publisher: IOP Publishing

Published year: 2020

DOI identifier: 10.1088/2053-1583/aba9a0

ISSN: 2053-1583