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Authors: Aasheesh Kolli, Vaibhav Gogte, Ali Saidi, Stephan Diestelhorst, William Wang, Peter M. Chen, Satish Narayanasamy, Thomas F. Wenisch
Journal title: IEEE Micro
Journal number: 39/3
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 94-102
DOI identifier: 10.1109/mm.2019.2910821
ISSN: 0272-1732