Moiré fringes in conductive atomic force microscopy

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Authors: L. Richarz, J. He, U. Ludacka, E. Bourret, Z. Yan, A. T. J. van Helvoort, and D. Meier

Journal title: Applied Physics Letters

Journal number: 122

Journal publisher: American Institute of Physics

Published year: 2023

Published pages: 162903

DOI identifier: 10.1063/5.0145173

ISSN: 0003-6951