Quantitative Mapping of Chemical Defects at Charged Grain Boundaries in a Ferroelectric Oxide

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Authors: Kasper A. Hunnestad, Jan Schultheiß, Anders C. Mathisen, Ivan N. Ushakov, Constantinos Hatzoglou, Antonius T. J. van Helvoort, Dennis Meier

Journal title: Advanced Materials

Journal number: 35

Journal publisher: United Nations Industrial Developement Organization

Published year: 2023

Published pages: 2302543

DOI identifier: 10.1002/adma.202302543

ISSN: 0935-9648