Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements in Bilayer and Trilayer Two-dimensional Materials

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Authors: Zachman, Michael J; Madsen, Jacob; Zhang, Xiang; Ajayan, Pulickel M; Susi, Toma; Chi, Miaofang

Journal title: Small

Journal number: 17 / 28

Journal publisher: Wiley - V C H Verlag GmbbH & Co.

Published year: 2021

Published pages: 2170142

DOI identifier: 10.1002/smll.202170142

ISSN: 1613-6810