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Authors: Rui Prada, Wishnu Prasetya, Fitsum Kifetew, Frank Dignum, Tanja E. J. Vos, Jason Lander, Jean-yves Donnart, Alexandre Kazmierowski, Joseph Davidson, Pedro M. Fernandes
Journal title: 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)
Journal publisher: IEEE
Published year: 2020
Published pages: 414-417
DOI identifier: 10.1109/icst46399.2020.00051
ISBN: 978-1-7281-5778-8
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