Automated test program reordering for efficient SBST

Summary

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Authors: R. Cantoro, E. Cetrulo, E. Sanchez, M. Sonza Reorda, A. Voza

Journal title: 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.1109/DCIS.2017.8311634

ISBN: 978-1-5386-5108-7