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Authors: A. Lebanov, A. Fantini, R. Degraeve, M. Nag, M. Willegems, S. Smout, S. Steudel, J. Genoe, P. Horemans, K. Mvnv
Journal title: 2018 48th European Solid-State Device Research Conference (ESSDERC)
Journal publisher: IEEE
Published year: 2018
Published pages: 66-69
DOI identifier: 10.1109/essderc.2018.8486854
ISBN: 978-1-5386-5401-9