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Authors: Marko Simicic, Geert Hellings, Shih-Hung Chen, Kris Myny, Dimitri Linten
Journal title: 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-7
DOI identifier: 10.23919/eos/esd.2018.8509748
ISBN: 978-1-5853-7302-4
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