Single-Look Multi-Master SAR Tomography: An Introduction

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Authors: Nan Ge, Richard Bamler, Danfeng Hong, Xiao Xiang Zhu

Journal title: IEEE Transactions on Geoscience and Remote Sensing

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/tgrs.2020.3002945

ISSN: 0196-2892