Dynamics of Photo‐Induced Surface Oxygen Vacancies in Metal‐Oxide Semiconductors Studied Under Ambient Conditions

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Authors: Daniel Glass, Emiliano Cortés, Sultan Ben‐Jaber, Thomas Brick, William J. Peveler, Christopher S. Blackman, Christopher R. Howle, Raul Quesada‐Cabrera, Ivan P. Parkin, Stefan A. Maier

Journal title: Advanced Science

Journal number: 6/22

Journal publisher: John Wiley & Sons Ltd

Published year: 2019

Published pages: 1901841

DOI identifier: 10.1002/advs.201901841

ISSN: 2198-3844