Efficient Artifact Removal from Low-Density Wearable EEG using Artifacts Subspace Reconstruction

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Authors: Velu Prabhakar Kumaravel, Victor Kartsch, Simone Benatti, Giorgio Vallortigara, Elisabetta Farella, Marco Buiatti

Journal title: 2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

Journal number: November 1, 2021

Journal publisher: IEEE

Published year: 2021

Published pages: 333-336

DOI identifier: 10.1109/embc46164.2021.9629771

ISBN: 978-1-7281-1179-7