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Authors: D. Roesel, M. Eremchev, T. Schönfeldová, S. Lee, S. Roke
Journal title: Appl. Phys. Lett.
Journal publisher: American Institute of Physics
Published year: 2022
DOI identifier: 10.1063/5.0085807
ISSN: 0003-6951
 
                             
                             
                            