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Authors: F. van der Weij; S. Steinert; I. van de Poel; J. Alleblas; A. Melnyk; T. de Wildt
Journal title: IEEE Technology and Society Magazine
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/mts.2023.3302406
ISSN: 1937-416X
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