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Authors: Markus Knoche, Istvan Sarandi, Bastian Leibe
Journal title: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
Journal publisher: IEEE
Published year: 2020
Published pages: 4499-4504
DOI identifier: 10.1109/cvprw50498.2020.00530
ISBN: 978-1-7281-9360-1