Microsecond time-resolved X-ray diffraction for the investigation of fatigue behavior during ultrasonic fatigue loading

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Authors: T. Ors, N. Ranc, M. Pelerin, V. Michel, V. Favier, O. Castelnau, C. Mocuta, D. Thiaudière

Journal title: Journal of Synchrotron Radiation

Journal number: 26/5

Journal publisher: Wiley

Published year: 2019

Published pages: 1660-1670

DOI identifier: 10.1107/s1600577519008518

ISSN: 1600-5775