Imaging Nanometer Phase Coexistence at Defects During the Insulator–Metal Phase Transformation in VO 2 Thin Films by Resonant Soft X-ray Holography

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Authors: Luciana Vidas, Christian M. Günther, Timothy A. Miller, Bastian Pfau, Daniel Perez-Salinas, Elías Martínez, Michael Schneider, Erik Gührs, Pierluigi Gargiani, Manuel Valvidares, Robert E. Marvel, Kent A. Hallman, Richard F. Haglund, Stefan Eisebitt, Simon Wall

Journal title: Nano Letters

Journal number: 18/6

Journal publisher: American Chemical Society

Published year: 2018

Published pages: 3449-3453

DOI identifier: 10.1021/acs.nanolett.8b00458

ISSN: 1530-6984