A contact resistance measurement setup for the study of novel contacts

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Authors: Rafael Puyol, Sebastian Suarez

Journal title: 2017 IEEE URUCON

Journal number: 23 - 25, October 2017

Journal publisher: IEEE

Published year: 2017

Published pages: 1-4

DOI identifier: 10.1109/urucon.2017.8171881

ISBN: 978-1-5386-3397-7