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Authors: Bing Sun, Xinjiang Wang, Xiaobo Ma, Zhongyuan Sun, Zhiqiang Wang, Zuxing Zhang, and Kaiming Zhou
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tim.2022.3181928
ISSN: 0018-9456
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