Summary
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Authors: Stefan Mach, Fabian Schuiki, Florian Zaruba, Luca Benini
Journal title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tvlsi.2020.3044752
ISSN: 1063-8210