Charge transfer sensitivity and dose efficiency with pixilated detectors and ptychographic phase contrast imaging in STEM

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Authors: Timothy Pennycook, Hao Yang, Clemens Mangler, Stefen Hummel, Bernhard Bayer, Jani Kotakoski, Peter Nellist, Jannik Meyer

Journal title: European Microscopy Congress 2016: Proceedings

Journal publisher: Wiley-VCH Verlag GmbH & Co. KGaA

Published year: 2016

Published pages: 721

DOI identifier: 10.1002/9783527808465.EMC2016.5972

ISBN: 9783-527808465