Learned Multi-patch Similarity

Summary

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Authors: Wilfried Hartmann, Silvano Galliani, Michal Havlena, Luc Van Gool, Konrad Schindler

Journal title: 2017 IEEE International Conference on Computer Vision (ICCV)

Journal publisher: IEEE

Published year: 2017

Published pages: 1595-1603

DOI identifier: 10.1109/ICCV.2017.176

ISBN: 978-1-5386-1032-9