Large-Scale Location Recognition and the Geometric Burstiness Problem

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Authors: Torsten Sattler, Michal Havlena, Konrad Schindler, Marc Pollefeys

Journal title: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Journal publisher: IEEE

Published year: 2016

Published pages: 1582-1590

DOI identifier: 10.1109/CVPR.2016.175

ISBN: 978-1-4673-8851-1