Role of Charge Traps in the Performance of Atomically Thin Transistors

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Iddo Amit, Tobias J. Octon, Nicola J. Townsend, Francesco Reale, C. David Wright, Cecilia Mattevi, Monica F. Craciun, Saverio Russo

Journal title: Advanced Materials

Journal number: 29/19

Journal publisher: United Nations Industrial Developement Organization

Published year: 2017

Published pages: 1605598

DOI identifier: 10.1002/adma.201605598

ISSN: 0935-9648