Comparing simulated impact of single frequency and multitone EMI for an integrated circuit

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Authors: Lokesh Devaraj, Alastair R. Ruddle, Qazi Mashaal Khan, Alistair P. Duff

Journal title: Proceedings of 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

Journal publisher: IEEE

Published year: 2022

Published pages: 107-111

DOI identifier: 10.1109/emccompo52133.2022.9758612