Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis

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Authors: L. Devaraj, Q. M. Khan, A. R. Ruddle, A. P. Duffy, R. Perdriau and M. Koohestani

Journal title: IEEE Transactions on Electromagnetic Compatibility

Journal number: 64 (6)

Journal publisher: IEEE

Published year: 2022

Published pages: 2067-2079

DOI identifier: 10.1109/temc.2022.3211458

ISSN: 1558-187X