Influence of Temperature on the EFT Immunity of Multistage Integrated Oscillators

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Authors: Q. M. Khan, M. Koohestani, R. Perdriau

Journal title: IEEE Transactions on Electromagnetic Compatibility

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/temc.2022.3225540

ISSN: 1558-187X