A System’s Perspective on the Use of EMI Detection and Correction Methods in Safety Critical Systems

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Authors: T. Claeys, H. Tirmizi, H. Habib, D. Vanoost, G. Vandenbosch, D. Pissoort

Journal title: 2021 Joint IEEE Symposium on EMC+SIPI and EMC Europe

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/emc/si/pi/emceurope52599.2021.9559314