Combining Fast Field Probes with an EMI Detector to reveal Bit Errors induced by ElectroMagnetic Disturbances

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Hasan Habib, Tim Claeys, Robert Vogt-Ardatjew, Bärbel van den Berg, Guy A. E. Vandenbosch, Davy Pissoort

Journal title: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe

Journal number: 20+

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/emceurope51680.2022.9901010