Evaluation of the A&S and the Advanced EMI Detectors Based on Modeling Frameworks With Appropriate Condition Assessment

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Authors: Habib, H., Claeys, T., Vandenbosch, G., Pissoort, D.

Journal title: IEEE Access

Journal number: IEEE Access ( Volume: 11)

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

Published pages: 72537-72551

DOI identifier: 10.1109/access.2023.3296095

ISSN: 2169-3536