Review of Statistical and Analytical Degradation Models for Photovoltaic Modules and Systems as Well as Related Improvements

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Authors: Sascha Lindig, Ismail Kaaya, Karl-Anders Weis, David Moser, Marko Topic

Journal title: IEEE Journal of Photovoltaics

Journal number: 8/6

Journal publisher: IEEE Electron Devices Society

Published year: 2018

Published pages: 1773-1786

DOI identifier: 10.1109/jphotov.2018.2870532

ISSN: 2156-3381