Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Tom Wirtz, Olivier De Castro, Antje Biesemeier, Hung Quang Hoang, Jean-Nicolas Audinot

Journal title: Microscopy and Microanalysis

Journal number: 26/S2

Journal publisher: Cambridge University Press

Published year: 2020

Published pages: 1972-1974

DOI identifier: 10.1017/s1431927620019984

ISSN: 1431-9276