In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for High-Resolution Nano-Analytics in Life Sciences

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Authors: Jelena Lovric, Jean-Nicolas Audinot, Tom Wirtz

Journal title: Microscopy and Microanalysis

Journal number: 25/S2

Journal publisher: Cambridge University Press

Published year: 2019

Published pages: 1026-1027

DOI identifier: 10.1017/s1431927619005865

ISSN: 1431-9276