Gap and Van Hove measurements via low-loss electron energy loss spectroscopy on atomically thin Mo<inf>x</inf>W<inf>(1-x)</inf>S<inf>2</inf> nanoflakes

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Authors: Mario Pelaez Fernandez, Kazu Suenaga, Raul Arenal

Journal title: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC)

Journal number: 09/12/2016

Journal publisher: IEEE

Published year: 2016

Published pages: 1-2

DOI identifier: 10.1109/NMDC.2016.7777170

ISBN: 978-1-5090-4352-1