Reevaluating the Cr Evaporation Characteristics of Ce/Co Coatings for Interconnect Applications

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Authors: Mareddy Reddy, Jan-Erik Svensson, Jan Froitzheim

Journal title: ECS Transactions

Journal number: 103

Journal publisher: IOPScience

Published year: 2021

Published pages: 1899

DOI identifier: 10.1149/10301.1899ecst