Data-driven Prognostics for PEM Fuel Cell Degradation by Long Short-term Memory Network

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Authors: Rui Ma, Elena Breaz, Chen Liu, Hao Bai, Pascal Briois, Fei Gao

Journal title: 2018 IEEE Transportation Electrification Conference and Expo (ITEC)

Journal publisher: IEEE

Published year: 2018

Published pages: 102-107

DOI identifier: 10.1109/itec.2018.8449962

ISBN: 978-1-5386-3048-8