Characterization of wafer-scale CVD graphene grown on sapphire and SiC: a direct comparison

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Authors: Jakub Sitek, Clifford McAlesee , Ben Conran , Iwona Pasternak , Karolina Czerniak-Losiewicz, Mariusz Zdrojek , Ken Teo, Wlodek Strupinski

Journal publisher: Graphene Week 2019

Published year: 2019

DOI identifier: 10.5281/zenodo.3475140