Wafer-scale graphene quality assessment using micro four-point probe mapping

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Authors: David M A Mackenzie, Kristoffer G Kalhauge, Patrick R Whelan, Frederik W Østergaard, Iwona Pasternak, Wlodek Strupinski, Peter Bøggild, Peter U Jepsen, Dirch H Petersen

Journal title: Nanotechnology

Journal number: 31/22

Journal publisher: Institute of Physics Publishing

Published year: 2020

Published pages: 225709

DOI identifier: 10.1088/1361-6528/ab7677

ISSN: 0957-4484