Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence

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Authors: Lavrik, E.; Shiroya, M.; Schmidt, H. R.; Toia, A.; Heuser, J. M.

Journal title: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Journal number: 1021

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 165932

DOI identifier: 10.1016/j.nima.2021.165932

ISSN: 0168-9002