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Authors: D. Roesel; M. Eremchev; T. Schönfeldová; S. Lee; S. Roke
Journal title: Appl. Phys. Lett.
Journal number: 12
Journal publisher: American Institute of Physics
Published year: 2022
DOI identifier: 10.1063/5.0085807
ISSN: 0003-6951