Asymptotic Characterization of Localized Defect Modes: Su–Schrieffer–Heeger and Related Models

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Authors: Richard V. Craster, Bryn Davies

Journal title: Multiscale Modeling & Simulation

Journal number: 21

Journal publisher: Society for Industrial and Applied Mathematics

Published year: 2023

Published pages: 827-848

DOI identifier: 10.1137/22m1511217

ISSN: 1540-3459