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Authors: Michalis, M., Siogkas, P., Tsakanikas, V., Potsika, V., Pleouras, D., Sakellarios, N., Karagiannis, G., Galyfos, G., Sigala, F., Liasis, N., Jovanovic, M., Koncar, I. B., Kallmayer, M., & Fotiadis, D
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.5281/zenodo.10819653