SAFEXPLAIN: Safe and Explainable Critical Embedded Systems Based on AI

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Jaume Abella; Jon Perez; Cristofer Englund; Bahram Zonooz; Gabriele Giordana; Carlo Donzella; Francisco J. Cazorla; Enrico Mezzetti; Isabel Serra; Axel Brando; Irune Agirre; Fernando Eizaguirre; Thanh Hai Bui; Elahe Arani; Fahad Sarfraz; Ajay Balasubramaniam; Ahmed Badar; Ilaria Bloise; Lorenzo Feruglio; Ilaria Cinelli; Davide Brighenti; Davide Cunial

Journal title: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.23919/date56975.2023.10137128

ISSN: 1558-1101