Wafer-scale characterization for two-dimensional material layers

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Authors: A. Moussa, J. Bogdanowicz, B. Groven, P. Morin, M. Beggiato, M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir, J. Hung, A. Urbanowicz, R. Koret, I. Turovets, B. Lee, W.T. Lee, G. F. Lorusso, A.-L. Charley

Journal title: Japanese Journal of Applied Physics

Journal number: 63

Journal publisher: IOP Publishing

Published year: 2024

Published pages: 030802

DOI identifier: 10.35848/1347-4065/ad26bc

ISSN: 1347-4065